Atomic Force Microscope

Atomic Force Microscope

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Product Description

Being a foremost firm, we are providing an exclusive range of Atomic Force Microscope. It is measured in a nanometre, which is much more accurate. This microscope is used for collection of data involves touching the surface. It is equipped with a contemporary tools and techniques. Atomic Force Microscope allows the topographic characterization of surfaces. It has an ability to image in liquid with minimal sample preparation. It is also able to localize adhesion strength as well as magnetic forces.

 


DEXTROSE TECHNOLOGIES PRIVATE LIMITED

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